The high intensities of radiation produced by synchrotron light sources enable many unique characterization methods. For example, multi-wavelength anomalous diffraction can measure the crystal structure of proteins by using x-ray diffraction. But such characterization methods require narrow bands of wavelengths from the synchrotron beam, and current monochromator approaches may not produce sufficient resolution. This technology provides a way to isolate a narrow spectrum of wavelengths from a diverging synchrotron beam. It is a monochromator consisting of two crystals with curved surfaces in a confocal arrangement, which allows for focusing of the beam in two orthogonal planes, as well as maintaining a fixed beam offset. This technology may provide for increased efficiency and resolution of wavelength selection while also reducing the complexity of required optical components.
In traditional double crystal monochromators, achieving both a fixed beam offset and focusing capabilities cannot occur due to the flat crystal geometry. This technology utilizes asymmetrically cut crystals that both have curved surfaces to attain this desired performance. The first crystal is bent tangentially and the second crystal has sagittal curvature, allowing for increased control. The system results in improved energy resolution, and its high acceptance angle for radiation eliminates the need for additional optical components that are required by traditional double crystal monochromators.
Simulations of the performance of this technology on the National Synchrotron Light Source have shown that the achievable resolution is finer than 5 parts in 10,000.
Patent Pending (US20120281813)
Tech Ventures Reference: IR 2622