This technology is high-throughput testing method for characterizing wavelength division multiplexing (WDM) transmitters that can be used to decrease measurement time and simplify optical and photonic testing in electronic manufacturing.
As optic and photonic circuits grow in size and complexity, increased and robust testing will be integral to their manufacture and operation. Wavelength division multiplexing (WDM) transmitters are widely used in bandwidth applications, and it is necessary to determine the bandwidth of each modulator in the system. This is currently done in a step-by-step manner, resulting in slow testing and validation times and inefficiencies along the way. High-throughput bandwidth modulation is needed to keep on pace with the complexity of these optic systems.
This technology consists of a high-throughput and robust testing methods to characterize and screen wavelength division multiplexing (WDM) transmitters. The screening and tuning method consists of the generation of electronic frequency combs which allow individual bandwidths from different transmitters to be identified. This method decreases measurement time and allows it to be done with minimal processing power, parallelizing and simplifying the testing set-up for optical bandwidth systems.
IR CU18134
Licensing Contact: Greg Maskel