Columbia Technology Ventures

Method for quantifying and analyzing brain white matter

This technology is an automated method for quantifying white matter hyperintensities (WMH) on patient imaging data to diagnose and monitor patient neurological health.

Unmet Need: Quantitative and standardized assessment of white matter

Current methods for determining brain function rely on psychiatric evaluations, which can be imprecise and biased. Non-invasive imaging techniques, such as MRI, have been used clinically to compare brain composition for patients with or without neurological disorders such as depression and dementia. WMH have been identified in patients with cognitive, neurological, or psychiatric disorders in brain regions understood to be responsible for those dysfunctions. However, there are currently no analytical methods for identifying and quantifying WMH to monitor and diagnose patients with neurological disorders.

The Technology: High-resolution quantification and mapping of WMH for diagnostics and monitoring

This technology is an analytical method to identify and quantify hyperintensities in whole brain and regional WMH using sensitive imaging methods. One such method that can be used with this technology is fluid attenuated inverse recovery (FLAIR) MRI, which reduces artifacts from cerebrospinal fluid to help identify WMHs. For this approach, total WMH volume is calculated by identifying and quantifying WMH above a certain threshold and then mapping those regions onto a three dimensional brain to determine the volume for each registered lobe. Various types of image registrations can be used with this technique, highlighting its versatility. Therefore, this method provides an automated and computerized approach to precisely analyze patient WMH in an unbiased manner.

This technology has been validated using patient imaging data.

Applications:

  • Diagnostic tool for neurological diseases such as Alzheimer’s Disease
  • Monitor progression of neurological diseases
  • Study brain function

Advantages:

  • Precise quantification and mapping of intensities
  • Does not require new scanner technology
  • Adjustable thresholds for customizable mapping
  • Automated
  • Non-biased analysis

Lead Inventor:

Adam M. Brickman, PhD

Patent Information:

Patent Issued

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